（机电学院，2013年秋季第10周）

 

【主  题】：Applications of electron microscopy in materials science and engineering电镜在材料科学工程领域的应用

【主讲人】：Dean J. Miller教授，美国阿贡国家实验室（Argonne National Laboratory）电镜中心主任

【时  间】：2013年11月7日（星期四）下午15：00-17：00

【地  点】：机电学院大会议室（机械工程楼Z802B）

【主  办】：研究生工作部

【承  办】：机电学院

 

【主讲人简介】：

Dean J. Miller, materials scientist and the director of Electron Microscopy Center in Argonne National Laboratory in America, graduated and got his PhD from University of Illinois. From 1987 to 1988, Dean J. Miller worked as a research associate at Department of Materials Science and Engineering, University of Illinois. Then he was employed as a materials scientist at Materials Science Division of Argonne National Laboratory in America from 1989 to 2011, and as a senior materials scientist at Materials Science Division/Nanoscience and Technology Division of Argonne National Laboratory from 2011 to now. Since 2000, Dean J. Miller has acted as the director and group leader of Electron Microscopy Center at Argonne National Laboratory.

Research interest: Investigation of synthesis, microstructure, and mechanical properties of high temperature intermetallic alloys, characterized primarily by TEM to identify the nature of brittle behavior. Studies of fundamental relationships between microstructure and properties in electronic oxides and a variety of other materials, especially high temperature superconductors, advanced battery materials, and organic photovoltaics. Leadership as Principle Investigator of the EMC component of the TEAM (Transmission Electron erratioAbn-corrected Microscope) project, which led to the successful development of full aberration-correcting optics for electron microscopes and the addition of the first such corrected microscope to the EMC.

Dean J. Miller, 高级教授，美国阿贡国家实验室电镜中心主任，毕业于伊利诺伊大学并在伊利诺伊大学获得博士学位。1987-1988年，在伊利诺伊大学材料科学与工程学院担任科研助理，1989年至2011年，美国阿贡国家实验室材料科学部教授，2011年至今，阿贡国家实验室材料科学部和纳米科学技术部的高级教授，从2000年至今，一直担任阿贡国家实验室电镜中心主任和研究组长。

主要研究领域：具有改性结构金属间化合物的合成和材料性能表征，电子氧化物显微结构和性能之间的关系研究，TEAM的组装使用研究工作等等。

  One of the core foundations of materials science is the link between microstructure and properties. Electron microscopy has long been an important tool in understanding the structure and function of materials. Recent developments of electron microscopy provide unique capability for precise characterization of microstructure at the nanoscale especically using transmission electron microscopy （TEM）. In this presentation, the basic approaches of TEM and their advantages as applied in materials science will be discussed. The use of these approaches will be illustrated through a series of examples in which TEM has provided unique insight, including Li-ion batteries, high temperature superconductors, tribological/wear coatings and other materials.

材料科学工程的核心基础研究之一就是建立材料微观结构和性能之间的对应关系，而电子显微镜一直以来都是了解材料结构和功能的一项重要工具。近年来电镜的新发展，为电镜精确表征材料纳米级微观结构提供了独特的功能，尤其是透射电子显微镜（TEM）。此次报告会，Miller教授将介绍透射电镜（TEM）在材料科学领域的基本应用方法和优势，并以一系列例子进行具体讲解，包括锂离子电池、高温超导体、摩擦磨损表面层和其它材料等等，在这些应用过程中TEM发挥了独到的功能。